X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 285.0 20% (w/v) PEG 3350, 0.2 M Sodium phosphate, 0.05 M Na Acetate, VAPOR DIFFUSION, HANGING DROP, temperature 285.0K
Unit Cell:
a: 60.280 Å b: 65.900 Å c: 68.370 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.83 Solvent Content: 32.88
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.00 37.3 138370 7283 99.45 0.11496 0.13946 9.027
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.0 37.3 99.4 0.098 ? 10 5.5 146472 145655 1.0 -3.0 15
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.0 1.03 95.4 ? ? 1.96 4.0 10217
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.8266 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
XDS data scaling .
SHELX model building CDE
REFMAC refinement 5.7.0032
XDS data reduction .
XSCALE data scaling .
SHELX phasing CDE
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