X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 289 5 % w/v Tacsimate, 0.1 M HEPES, pH 7.0, 10% w/v PEGMME 5000, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 85.365 Å b: 89.820 Å c: 104.502 Å α: 81.41° β: 90.42° γ: 83.50°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.42 Solvent Content: 49.10
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.701 41.897 81984 4096 98.04 0.2197 0.2601 47.1
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 50 98.4 ? 0.125 6.4 2.3 82135 82135 0.0 0.0 45.22
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.7 2.75 98.0 ? 0.584 1.9 2.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97921 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
HKL-3000 data collection .
HKL-3000 phasing .
MOLREP phasing .
PHENIX refinement (phenix.refine: 1.8.1_1161)
HKL-3000 data reduction .
HKL-3000 data scaling .
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