X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 25 % PEG 3350, 0.2 M LiSO4, 0.1 M BisTris pH 6.5, AMP, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 124.015 Å b: 194.697 Å c: 147.507 Å α: 90.000° β: 91.310° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.07 Solvent Content: 40.67
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.9000 34.9800 261938 13161 95.6800 0.2195 0.2534 20.6767
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.880 50.000 95.100 0.125 ? 5.880 ? 283875 269966 0 -3.000 19.340
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.880 1.990 89.800 ? ? 1.690 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04-1 0.97949 Diamond I04-1
Software
Software Name Purpose Version
XSCALE data scaling .
BUSTER-TNT refinement BUSTER 2.10.0
PDB_EXTRACT data extraction 3.11
XDS data scaling .
Aimless data scaling .
BALBES phasing .
BUSTER refinement 2.10.0