X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 298 0.9 M ammonium sulphate, 0.15 M sodium citrate pH 5.6, 100 mM lithium sulphate, 1.5 mM cGMP , VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 60.051 Å b: 61.572 Å c: 67.844 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.09 Solvent Content: 41.16
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.2500 42.9900 69790 3514 99.3800 0.1383 0.1722 18.2068
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.220 45.594 99.000 ? 0.033 20.900 3.500 74662 74662 ? 1.0 12.210
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.220 1.290 95.800 ? 0.646 1.200 3.200 10447
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.9841 ESRF ID14-4
Software
Software Name Purpose Version
SCALA data scaling 3.3.20
PHASER phasing 2.5.1
PHENIX refinement 1.8.2_1309
PDB_EXTRACT data extraction 3.11
EDNA data collection .
XSCALE data scaling .