X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 291 30% PEG3350, 0.2 M sodium chloride, 0.1 M HEPES, 0.005 M SAH, pH 7.5, VAPOR DIFFUSION, temperature 291K
Unit Cell:
a: 103.554 Å b: 43.247 Å c: 119.454 Å α: 90.000° β: 99.170° γ: 90.000°
Symmetry:
Space Group: I 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.40 Solvent Content: 48.78
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.650 40.64 62292 1907 98.37 0.1699 0.1955 34.4981
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 42.09 99.3 0.054 ? 13.2 3.7 ? 62809 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.650 1.680 98.100 ? ? 1.200 3.800 3048
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97856 APS 19-ID
Software
Software Name Purpose Version
Aimless data scaling 0.1.29
PHASER phasing .
REFMAC refinement .
PDB_EXTRACT data extraction 3.12
XDS data reduction .
Feedback Form
Name
Email
Institute
Feedback