X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 93 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SYNCHROTRON | ELETTRA BEAMLINE 5.2R | 0.97927, 0.97942, 0.95373 | ELETTRA | 5.2R |
| Software Name | Purpose | Version |
|---|---|---|
| Auto-Rickshaw | phasing | . |
| CNS | refinement | . |
| MOSFLM | data reduction | . |
| SCALA | data scaling | . |
