X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 289 0.2M CaCl2, 0.1M Tris, 25% PEG4000, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 59.678 Å b: 72.741 Å c: 71.306 Å α: 90.000° β: 101.320° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.24
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.7200 35.8000 62314 3158 98.6900 0.1380 0.1930 18.5384
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.72 50.00 99.9 0.107 ? 19.9 4.6 63028 62981 ? -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.73 1.76 99.3 ? ? 2.09 3.3 3151
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97927 APS 19-BM
Software
Software Name Purpose Version
REFMAC refinement 5.7.0029
PDB_EXTRACT data extraction 3.11
SBC-Collect data collection COLLECT
HKL-3000 data reduction .
HKL-3000 data scaling .
HKL-3000 phasing .
MLPHARE phasing .
DM phasing .
SHELXDE phasing .
ARP/wARP model building .
RESOLVE phasing .
Coot model building .
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