X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 293 30% (w/v) PEG 8000, 0.05M sodium cacodylate 0.2M ammonium acetate, 0.01M magnesium acetate, pH 8.5, VAPOR DIFFUSION, temperature 293K
Unit Cell:
a: 112.236 Å b: 112.236 Å c: 82.072 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 2.22 Solvent Content: 44.49
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? ? 3.0510 32.4000 3895 178 100.0000 0.2267 0.2529 75.3667
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.051 62.708 100.000 ? 0.093 20.300 10.000 3900 3900 0 -3 75.530
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.050 3.210 100.000 ? 0.713 1.100 10.500 551
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.0000 APS 17-ID
Software
Software Name Purpose Version
SCALA data scaling 3.3.20
PHASER phasing 2.3.0
PHENIX refinement 1.7.2_869
PDB_EXTRACT data extraction 3.11
JDirector data collection .
XDS data reduction .