X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.1 293 13% (w/v) polyethylene glycol (PEG) 8000, 200 mM MgCl2 and 100 mM Bis-Tris buffer, pH 5.1, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 102.930 Å b: 211.450 Å c: 108.350 Å α: 90.000° β: 102.690° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.48 Solvent Content: 50.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 2.4000 48.8500 174735 8462 99.3400 0.2173 0.2447 64.5717
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 48.9 95.600 0.064 ? 7.780 ? ? 333757 ? -3.000 54.586
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.400 2.460 94.700 ? ? 1.320 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.99989 SLS X10SA
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.1
DM phasing .
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
DA+ data collection .
XDS data reduction .
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