X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 289 0.1M MgCl2, 0.1M MES:NaOH, 30% (v/v) PEG400, pH 6.5, MICRODIALYSIS, temperature 289K
Unit Cell:
a: 154.052 Å b: 48.173 Å c: 44.916 Å α: 90.00° β: 102.74° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.56 Solvent Content: 51.97
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.020 34.720 20669 1060 96.96 0.1827 0.2268 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.02 35.0 97.3 0.087 ? 20.5 3.3 20707 20707 0 -5 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.02 2.05 81.8 ? ? 1.90 2.5 867
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97915, 0.97938 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
SHELXD phasing .
MLPHARE phasing .
DM model building .
ARP model building .
WARP model building .
HKL-3000 phasing .
PHENIX refinement (phenix.refine: 1.8.2_1309)
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing .