X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 289 MCSG1(a1): 0.1 M HEPES/NaOH, pH 7.5, 20% PEG8000, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 40.240 Å b: 47.480 Å c: 67.970 Å α: 90.000° β: 105.640° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.22 Solvent Content: 44.65
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.850 38.78 21205 1091 99.63 0.1665 0.2109 24.264
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.850 50 99.6 0.059 ? 18.93 4.1 21300 21213 0 -3.0 28.044
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.850 1.900 99.8 ? ? 2.290 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.9786 APS 21-ID-G
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.2
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
HKL-2000 data collection .
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