X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 289 10% PEG 6000, 0.1M MES, 1.0M lithium chloride, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 289K
Unit Cell:
a: 135.704 Å b: 179.644 Å c: 71.510 Å α: 90.00° β: 89.77° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.81 Solvent Content: 56.19
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.100 44.911 99440 4968 99.94 0.1596 0.1951 24.1404
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 50.0 100.0 0.158 0.158 14.346 6.9 99475 99475 -3.0 0.0 21.370
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.18 100.0 ? 0.357 5.630 6.9 686821
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.97915 SSRF BL17U
Software
Software Name Purpose Version
HKL-2000 data collection .
AutoSol phasing .
PHENIX refinement (phenix.refine: 1.7.1_743)
HKL-2000 data reduction .
SCALA data scaling .