X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 287 10% PEG 3350, 50 mM HEPES-Na salt, pH 7.5, vapor diffusion, hanging drop, temperature 287K
Unit Cell:
a: 172.025 Å b: 78.175 Å c: 124.450 Å α: 90.00° β: 126.30° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.92 Solvent Content: 57.82
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.20 42.684 67506 3376 99.27 0.1779 0.2176 45.3370
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.200 50 98.900 0.051 ? 15.020 ? 68231 67514 2.0 -3.000 52.183
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.200 2.330 98.800 ? ? 1.680 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.9184, 1.8448, 1.8454 BESSY 14.1
Software
Software Name Purpose Version
XSCALE data scaling .
SOLOMON phasing .
PHENIX refinement 1.8.2_1309
PDB_EXTRACT data extraction 3.11
MAR345 data collection .
XDS data reduction .
XDS data scaling .
SHARP phasing .