X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 40% (v/v) Isopropanol, 0.1 M Imidazole acid, 15% (w/v) PEG 8000, pH 6.5, vapor diffusion, temperature 293K
Unit Cell:
a: 69.358 Å b: 46.433 Å c: 76.689 Å α: 90.000° β: 105.580° γ: 90.000°
Symmetry:
Space Group: I 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.15 Solvent Content: 42.72
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.1000 24.7040 93221 4689 97.8800 0.1348 0.1456 15.3909
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.100 57.885 98.300 0.045 ? 12.1 3.400 93517 93517 0 -3 11.250
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.10 1.12 98.4 ? ? 1.9 3.2 4593
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 0.8265 APS 17-ID
Software
Software Name Purpose Version
SCALA data scaling 0.1.27
PHASER phasing 2.5.3
PHENIX refinement dev_1228
PDB_EXTRACT data extraction 3.11
JDirector data collection .
XDS data reduction .