X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.4 288 100 mM sodium citrate (pH 5.4), 30% polyethylene glycol 400, 200 mM KH2PO4 with 4% (v/v) 1,4-butanediol, VAPOR DIFFUSION, SITTING DROP, temperature 288K
Unit Cell:
a: 130.177 Å b: 51.393 Å c: 114.308 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.25 Solvent Content: 45.41
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.548 38.215 105632 1908 94.02 0.1696 0.1962 26
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.55 50.00 98.6 0.061 0.061 24.5 5.8 110705 109110 0 -3 16.51
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.55 1.61 96.9 ? 0.734 2.6 5.4 10745
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.9795 NSLS X29A
Software
Software Name Purpose Version
CBASS data collection .
PHENIX model building .
PHENIX refinement (phenix.refine: 1.5_2)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .