X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.2 285 10mM Cobalt chloride, 50mM succinic acid pH 4.2, 1.2M 1,6 hexanediol., VAPOR DIFFUSION, HANGING DROP, temperature 285K
Unit Cell:
a: 75.010 Å b: 75.010 Å c: 209.000 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 3.18 Solvent Content: 61.36
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.7000 53.0400 30982 1561 99.0300 0.1979 0.2503 43.3294
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.700 70.601 99.000 ? 0.179 10.700 6.600 16951 16951 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.700 2.850 99.800 ? 0.895 0.900 6.600 2432
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R 1.5418 ? ?
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling 3.3.21
PHASER phasing 2.5.2
PHENIX refinement 1.8.2_1309
PDB_EXTRACT data extraction 3.11
CrystalClear data collection .