X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 298 18% PEG-3350, 0.1 M Bis-Tris pH 5.5, 0.2 M MgCl2, 10mM DTT, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 56.310 Å b: 83.940 Å c: 99.200 Å α: 102.560° β: 89.020° γ: 107.640°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.30 Solvent Content: 46.60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.1900 19.66 25938 1302 ? 0.2099 0.2520 50.7810
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.190 19.66 92.100 0.175 ? 4.600 1.8 25955 25955 ? -3.000 37.052
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.190 3.270 89.200 ? ? 1.000 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.9791 APS 24-ID-E
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.1.4
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.11
XDS data reduction .
BUSTER refinement 2.8.0