X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 298 18% PEG-4000, 50mM sodium citrate pH 5.6, 16% propanol, 1mM DTT, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 43.800 Å b: 76.390 Å c: 113.760 Å α: 90.000° β: 93.910° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.96 Solvent Content: 37.30
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.8000 18.1 68966 3448 99.4800 0.1684 0.1910 28.0407
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 18.1 99.5 0.045 ? 21.01 3.7 69030 69030 ? -3 22.45
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.85 99.5 ? 51.5 3.17 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.9641 APS 24-ID-C
Software
Software Name Purpose Version
SCALEPACK data scaling .
PHASER phasing 2.3.0
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.11
XDS data reduction .
XSCALE data scaling .
BUSTER refinement 2.10.0