ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.5	277	100 mM bis-Tris (pH 6.5), 25% polyethylene glycol 3350, 200 mM Li2SO4, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Unit Cell:

a: 99.462 Å b: 99.462 Å c: 105.079 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 43 2 2

Crystal Properties:

Matthew's Coefficient: 2.59 Solvent Content: 52.53

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.001	46.456	34443	1902	95.11	0.1744	0.2007	35.20

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.00	50.00	100.00	0.127	0.127	19.250	11.4	36235	36220	0	-3	27.84

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.00	2.07	99.8	?	0.857	2.93	9.7	3570

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X25	1.100	NSLS	X25

Software