X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.2 291 40MM KH2PO4, 5% PEG 8000, 20% GLYCEROL, pH 4.2, VAPOR DIFFUSION, temperature 291K
Unit Cell:
a: 39.128 Å b: 46.493 Å c: 61.409 Å α: 68.16° β: 81.47° γ: 75.28°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.19 Solvent Content: 43.96
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS ? 1.08 22.48 142636 1463 ? 0.1436 0.183 16.1068
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.080 23.400 98.9 ? ? ? ? 144252 142636 2.0 2.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.2 ? BESSY 14.2
Software
Software Name Purpose Version
SHELX refinement .
PDB_EXTRACT data extraction 3.11
SHELXL refinement .