4L1W
X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 110 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
SYNCHROTRON | APS BEAMLINE 31-ID | 0.979310 | APS | 31-ID |
Software Name | Purpose | Version |
---|---|---|
HKL-2000 | data collection | . |
PHASES | phasing | . |
REFMAC | refinement | 5.7.0029 |
MOSFLM | data reduction | . |
SCALA | data scaling | . |