X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 291 16% PEG6000, 0.1 M Tris-HCl, 0.2 M LiCl, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 291K
Unit Cell:
a: 94.275 Å b: 97.976 Å c: 109.849 Å α: 76.570° β: 80.710° γ: 78.910°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.00 Solvent Content: 59.04
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.0750 29.8270 67479 3407 97.6000 0.2353 0.2803 54.2796
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.070 30.0 97.400 0.060 ? 17.010 3.5 ? 67490 ? -3.000 81.195
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.070 3.260 92.600 ? ? 2.090 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04 0.97625 Diamond I04
Software
Software Name Purpose Version
XSCALE data scaling .
PHENIX refinement 1.8.1_1168
PDB_EXTRACT data extraction 3.11
GDA data collection .
XDS data reduction .
XDS data scaling .
PHASER phasing .