X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.00 277 2.5M NACL, 0.1M IMIDAZOLE, 0.2M ZN(ACO)2, PH 8.00, VAPOR DIFFUSION, TEMPERATURE 277K
Unit Cell:
a: 50.783 Å b: 59.230 Å c: 88.186 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 2.40 Solvent Content: 49.40
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.00 19.28 17530 944 99.42 0.18767 0.22986 39.356
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 50.000 99.7 0.05300 ? 55.0270 18.300 18707 18652 0 -3.000 31
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 100.0 ? ? 12.700 16.10 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.98011, 0.98031, 0.96487 APS 19-ID
Software
Software Name Purpose Version
HKL-2000 data collection .
SHELXD phasing .
MLPHARE phasing .
SOLVE phasing .
RESOLVE model building .
REFMAC refinement 5.7.0029. HKL3000
Coot model building .
HKL-2000 data reduction .
HKL-2000 data scaling .
RESOLVE phasing .