X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.4 295 0.2M MAGNESIUM CHLORIDE, 0.1M TRIS-HCL, 20% PEG8000, 0.01M NICKEL CHLORIDE, pH 8.4, vapor diffusion, hanging drop, temperature 295K
Unit Cell:
a: 42.820 Å b: 46.950 Å c: 47.540 Å α: 77.270° β: 68.350° γ: 74.470°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.20 Solvent Content: 44.09
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.5000 43.8200 48069 2432 91.5000 0.1527 0.1846 15.6201
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.500 50.0 91.400 0.048 ? 15.560 ? 52615 48069 ? -3.000 19.151
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.500 1.540 57.900 ? ? 2.040 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.0 APS 22-ID
Software
Software Name Purpose Version
XSCALE data scaling .
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
SERGUI data collection .
XDS data reduction .
PHASER phasing .
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