X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.0 289 2.4M ammonium sulfate, 150 mM Formate pH 4.0, 3% 2-Butanol, 3mM rhenium chloride , VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 123.644 Å b: 141.068 Å c: 122.590 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.60 Solvent Content: 52.63
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.4999 34.089 36246 1946 96.99 0.207 0.259 64.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4999 50 99.6 ? 0.08 15.3 5.4 37152 37152 0.0 0.0 58.32
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.4999 2.54 99.8 ? 0.782 2.03 4.3 1831
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97899 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
HKL-3000 data collection .
HKL-3000 phasing .
SHELX model building .
RESOLVE model building .
BUCCANEER model building .
PHENIX refinement (phenix.refine: dev_1227)
HKL-3000 data reduction .
HKL-3000 data scaling .
SHELX phasing .
RESOLVE phasing .
BUCCANEER phasing .