X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.7 293 16 % PEG3350, 130 mM lithium sulfate, 0.25 % w/v salicylamide, pH 7.7, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 57.168 Å b: 67.986 Å c: 212.151 Å α: 92.73° β: 96.95° γ: 110.15°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.56 Solvent Content: 51.92
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.895 49.759 53184 1913 83.4487 ? 0.2589 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.895 50.0 98.0 0.124 ? 13.8 8.0 65054 63752 2.0 2.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.895 3.0 84.4 ? ? 1.8 7.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 0.9784 NSLS X6A
Software
Software Name Purpose Version
ADSC data collection Quantum
SnB phasing .
CNS refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .