ISDA: 4JSB

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.5	289	0.05M Ammonium sulfate, 0.05M BisTris, 30% v/v Pentaerythritol ethoxylate (15/4 EO/OH) , pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Unit Cell:

a: 108.005 Å b: 108.005 Å c: 108.005 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 21 3

Crystal Properties:

Matthew's Coefficient: 3.30 Solvent Content: 62.76

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	1.87	38.21	32884	1734	99.63	0.14163	0.16400	28.830

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.87	38.21	99.63	0.129	0.129	23.4	13.7	32884	32884	0	-3	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.874	1.922	97.02	?	?	?	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-F	0.97957	APS	21-ID-F

Software