X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 ? Crystals were grown using the bicelle method. The crystallization buffer was 32% v/v (+/-)-2-methyl-2,4-pentanediol, 100 mM sodium acetate pH 4.5 and 20 mM calcium chloride, VAPOR DIFFUSION
Unit Cell:
a: 87.267 Å b: 101.952 Å c: 87.357 Å α: 90.00° β: 119.52° γ: 90.00°
Symmetry:
Space Group: I 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.18 Solvent Content: 43.49
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.31 21.16 27109 1454 98.08 0.21087 0.26596 46.863
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.30 38.01 98.3 0.092 ? 11.3 5.0 ? 28615 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.43 90.1 ? ? 1.9 4.0 3562
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.979 SLS X06SA
Software
Software Name Purpose Version
PHASER phasing .
REFMAC refinement 5.6.0117
XDS data reduction .
XDS data scaling .