X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 110 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SYNCHROTRON | ALS BEAMLINE 5.0.2 | 1.00 | ALS | 5.0.2 |
| Software Name | Purpose | Version |
|---|---|---|
| BOS | data collection | . |
| PHASER | phasing | . |
| REFMAC | refinement | 5.6.0117 |
| HKL-2000 | data reduction | . |
| SCALEPACK | data scaling | . |
