X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 298 30% PEG 8000, 100mM Imidazole/Hydrochloric acid pH 8.0, 200mM sodium chloride, Vapor diffusion, Sitting drop, temperature 298K
Unit Cell:
a: 201.793 Å b: 117.313 Å c: 143.127 Å α: 90.000° β: 99.770° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.38 Solvent Content: 48.32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.8000 39.4100 75912 3989 98.5700 0.1971 0.2530 85.245
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.800 55.536 96.000 0.053 0.095 8.800 3.700 77549 77549 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.800 2.950 92.500 ? 0.379 2.000 3.400 10798
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.978 NSLS X29A
Software
Software Name Purpose Version
SCALA data scaling 3.3.20
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
CBASS data collection .
MOSFLM data reduction .
MOLREP phasing .