X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 100mM HEPES pH7.5, 25% PEG 4000, 200mM (NH4)2SO4, 100mM KCl, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 278.508 Å b: 78.395 Å c: 73.197 Å α: 90.00° β: 101.02° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.64 Solvent Content: 53.48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.8474 42.308 127608 1991 96.27 0.2062 0.2405 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.847 50 96.4 ? 0.031 45.0 3.6 ? 127643 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.847 1.88 89.4 ? 0.319 4.8 3.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97942 NSLS X4A
Software
Software Name Purpose Version
HKL-2000 data collection .
AMoRE phasing .
PHENIX refinement (phenix.refine: 1.8.1_1168)
HKL-2000 data reduction .
HKL-2000 data scaling .