4J94

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.77 293 0.1M Bis-Tris propane 0.18 M sodium thiocyanate 26% PEG 3350, pH 6.77, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 56.490 Å b: 77.290 Å c: 84.930 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.20 Solvent Content: 44.06
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.8570 37.2180 27657 1389 86.2000 0.1571 0.1913 17.3995
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.581 47.040 99.900 ? 0.070 13.400 5.000 ? 27671 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.250 2.370 100.000 ? 0.206 3.600 5.000 3177
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 77 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08B1-1 0.97895 CLSI 08B1-1
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling 3.3.20
PHASER phasing .
PHENIX refinement dev_1284
PDB_EXTRACT data extraction 3.11
DNA data collection .