X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.2 290.0 20% PEG-3350, 0.2M Na Formate, pH 7.2, VAPOR DIFFUSION, SITTING DROP, temperature 290.0K
Unit Cell:
a: 63.380 Å b: 67.116 Å c: 67.440 Å α: 99.800° β: 102.940° γ: 89.940°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.92 Solvent Content: 57.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.3100 42.4900 45698 1408 97.1100 0.1911 0.2339 65.6453
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 50.000 97.600 0.060 ? 8.700 2.200 ? 45699 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.300 2.340 96.000 ? ? ? 2.100 2255
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.9791 NSLS X29A
Software
Software Name Purpose Version
REFMAC refinement 5.7.0029
SCALEPACK data scaling .
PHENIX refinement .
PDB_EXTRACT data extraction 3.11
CBASS data collection .
HKL-3000 data reduction .
HKL-3000 data scaling .
PHASER phasing .
DENZO data reduction .
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