X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 298 18 % (w/v) PEG 6,000, 2 % (v/v) 1,6-hexanediol, 0.05 M ammonium sulfate and 0.1 M sodium acetate pH 4.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 52.560 Å b: 56.130 Å c: 108.520 Å α: 79.790° β: 84.850° γ: 70.220°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.29 Solvent Content: 46.32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THIN SHELLS 2.3000 45.4200 47059 2390 92.2400 0.1927 0.2179 52.8599
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 106.7 92.3 ? ? ? ? 47094 47059 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 . ? 93.5 ? ? 3.00 3.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04 0.9763 Diamond I04
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
PHASER phasing .
BUSTER-TNT refinement BUSTER 2.10.0
PDB_EXTRACT data extraction 3.11
GDA data collection .
BUSTER refinement 2.10.0