4J3E

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 278 100 mM ADA, pH 6, 50% SATURATED AMMONIUM SULFATE, 5% PEG200, 5 mM DTT RESERVOIR MIXED IN EQUAL VOLUME WITH THE PROTEIN AT 10 mg/mL, VAPOR DIFFUSION, HANGING DROP, temperature 278K
Unit Cell:
a: 42.887 Å b: 67.657 Å c: 67.173 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.45 Solvent Content: 49.70
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.91 24.63 7488 384 95.6 0.196 0.239 14.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.91 50. 95.3 0.039 ? 46.1 3.8 ? 7488 0.000 ? 10.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.91 1.98 85.9 ? ? 29.8 2.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C 1.0000 NSLS X8C
Software
Software Name Purpose Version
HKL-2000 data collection .
MOLREP phasing .
CNX refinement 2005
HKL-2000 data reduction .
HKL-2000 data scaling .