X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.2 289 0.1M PHOSPHATE-CITRATE, 40% PEG300, PH 4.2, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 33.080 Å b: 38.394 Å c: 130.765 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.98 Solvent Content: 37.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.44 28.81 30371 1542 97.8 0.180 0.204 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.440 28.900 97.9 0.07800 ? 46.1000 6.800 30476 30476 0 -3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.44 1.46 85.2 ? ? 4.200 5.00 1285
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97923 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
SHELXD phasing .
MLPHARE phasing .
DM model building .
ARP model building .
WARP model building .
HKL-3000 phasing .
PHENIX refinement (PHENIX.REFINE: 1.8.1_1168)
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing .
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