X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 290 Molecular dimersions Morpheus screen b11: 10% PEG 4000, 20% glycerol, 30mM NaF, 30mM NaBr, 30mM NaI, 100mM Bicine/Tris pH 8.5; LeinA.00674.a.BV2.PC00092 at 21.3mg/ml, VAPOR DIFFUSION, SITTING DROP, temperature 290K
Unit Cell:
a: 98.960 Å b: 98.960 Å c: 199.260 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 32 2 1
Crystal Properties:
Matthew's Coefficient: 2.82 Solvent Content: 56.37
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.3500 36.1360 47749 2416 99.8600 0.1748 0.2059 60.3464
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.350 50 99.800 0.069 ? 13.810 4.6 47821 47821 0 -3.000 51.197
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.350 2.410 99.900 ? ? 2.550 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97872 APS 21-ID-F
Software
Software Name Purpose Version
PHENIX refinement dev_1269
PHASER phasing 2.5.2
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
XDS data reduction .
XSCALE data scaling .