X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 298 200 mM ammonium sulfate, 18% PEG 4000, 200 mM HEPES pH 7.0, 5% 2-METHYL-2,4-PENTANEDIOL, 0.5 mM beta-octyl glucoside, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 92.620 Å b: 127.328 Å c: 129.600 Å α: 90.00° β: 90.25° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.14 Solvent Content: 60.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.05 29.775 57732 5877 99.50 0.1829 0.2452 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.05 30.0 99.9 0.131 ? 13.6 5.8 57781 57775 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.05 3.16 100 ? ? 2.2 5.9 5717
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 1.1271 APS 21-ID-D
Software
Software Name Purpose Version
PHENIX refinement 1.8_1069
CNS refinement .
PHENIX model building .
HKL-2000 data reduction .
HKL-2000 data scaling .
CNS phasing .
PHENIX phasing .
HKL-2000 data collection .
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