X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 295 28% w/v PEG4000, 0.2 M magnesium chloride, 0.1 M Tris-HCl pH 8.5, 1 mM spermine, VAPOR DIFFUSION, HANGING DROP, temperature 295K
Unit Cell:
a: 118.570 Å b: 42.310 Å c: 71.810 Å α: 90.00° β: 117.11° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.11 Solvent Content: 41.77
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.800 19.733 29279 1464 98.63 0.1883 0.2270 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 20 98.3 .069 ? 15.6 3.1 29280 29280 -3.0 -3.0 18.98
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.8499 99.1 ? ? 1.75 3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.115869 ALS 8.3.1
Software
Software Name Purpose Version
PHENIX refinement (phenix.refine: 1.8_1069)
PHASER phasing .
ELVES refinement .
XDS data reduction .
XDS data scaling .