X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 278.0 50% SATURATED AMMONIUM SULFATE, 100 mM BIS-TRIS, pH 6.5, 5% (V/V) PEG200, 5 mM DTT, VAPOR DIFFUSION, HANGING DROP, temperature 278.0K
Unit Cell:
a: 43.083 Å b: 67.493 Å c: 66.724 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.47 Solvent Content: 50.14
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.70 33.75 10703 548 96.9 0.209 0.229 16.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.55 36.3 82.6 0.037 ? 20.3 3.58 14473 11957 0.0 0.0 23.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.55 1.61 20.5 ? ? 3.3 1.99 290
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X8C 1.0000 NSLS X8C
Software
Software Name Purpose Version
CrystalClear data collection .
MOLREP phasing .
CNX refinement 2005
d*TREK data reduction .
d*TREK data scaling .