X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.3 277 100 mM HEPES pH 7.3 and 7-10%(w/v) PEG 8.000, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 35.090 Å b: 76.990 Å c: 50.570 Å α: 90.000° β: 104.860° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.92 Solvent Content: 35.94
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.6000 40.0 33029 991 96.3 0.1610 0.1835 13.2112
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.600 40.0 96.300 0.027 ? 32.480 3.17 34309 33029 ? -3.000 19.076
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.600 1.700 91.600 ? ? 12.200 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE BRUKER AXS MICROSTAR 1.54170 ? ?
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 1.3.1
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
XDS data scaling .
XDS data reduction .
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