X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 294 14.5% PEG 8,000, 0.1M Na Acetate trihydrate pH 4.8-5.5, 0.2-0.38 M K acetate, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 38.666 Å b: 66.050 Å c: 94.518 Å α: 71.85° β: 87.38° γ: 74.26°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.50 Solvent Content: 50.79
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.37 37.18 11738 605 97.1 0.233 0.279 69.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.37 42.99 97.4 0.085 ? 10.0 3.5 12057 11744 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.37 3.56 96.9 ? ? 2.6 3.5 1723
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 98 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.0 APS 17-ID
Software
Software Name Purpose Version
JDirector data collection .
CNX refinement .
autoPROC data scaling .
SCALA data scaling .
CNX phasing .