X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 298 0.2M NaCl, 0.1M BIS-TRIS pH 5.5, 25% PEG 4K, Vapor diffusion, Sitting drop, temperature 298K
Unit Cell:
a: 51.907 Å b: 49.261 Å c: 51.867 Å α: 90.000° β: 116.980° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.12 Solvent Content: 41.93
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.7000 40.000 22736 1140 87.4100 0.1884 0.2259 18.7203
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.700 40.000 100.000 0.060 0.045 22 4.300 25886 25886 ? ? 14.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.700 1.730 100.000 ? ? ? 4.200 1267
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.9793 NSLS X29A
Software
Software Name Purpose Version
SCALEPACK data scaling .
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
CBASS data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
MOLREP phasing .
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