X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 298 Succinic acid, HEPES, PEG MME 2000, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 60.221 Å b: 69.538 Å c: 80.727 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 2 2
Crystal Properties:
Matthew's Coefficient: 2.28 Solvent Content: 45.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.0000 40.36 21980 1118 100 0.2065 0.2449 45.4661
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.00 40.36 93.28 0.039 ? 39.6302 13.46 21998 21998 0 6.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.11 95.21 ? ? ? 9.57 3204
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-1 0.933 ESRF ID14-1
Software
Software Name Purpose Version
SCALA data scaling CCP4_3.3.20
REFMAC refinement refmac_5.7.0029
PDB_EXTRACT data extraction 3.11
XDS data scaling .
XSCALE data scaling .
CRANK phasing .