ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	293	28% Jeffamine ED-2001 0.05M HEPES pH 7.5 10% Methyl-2,4-pentanediol (MPD)., VAPOR DIFFUSION, SITTING DROP, temperature 293K

Unit Cell:

a: 109.780 Å b: 109.780 Å c: 107.020 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 41 2 2

Crystal Properties:

Matthew's Coefficient: 6.2 Solvent Content: 80.15

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	?	4.000	29.911	5885	567	99.88	0.2916	0.3231	211.998

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
4.0	110.43	99.77	?	0.062	16.8	7.7	?	5887	22.03	66.49	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	4.10	4.32	99.8	?	0.83	?	8.1	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SSRL BEAMLINE BL12-2	1.08	SSRL	BL12-2

Software