X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 289 0.2M Sodium Acetate, 0.1M HEPES:NaOH, 20%(w/v) PEG3000, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 46.668 Å b: 81.560 Å c: 105.425 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.36 Solvent Content: 47.87
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.302 30.708 18174 932 98.40 0.1976 0.2567 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.30 31.0 98.9 0.102 ? 26.4 7.1 18258 18258 0 0 43.23
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.34 98.1 ? ? 2.4 6.9 899
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97926, 0.97951 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
SHELXD phasing .
MLPHARE phasing .
DM model building .
ARP model building .
WARP model building .
HKL-3000 phasing .
PHENIX refinement (phenix.refine: 1.7.1_743)
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing .
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