X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 277 20% PEG 4000, 0.1M magnesium sulfate, 0.1M Tris-HCl, pH 8.0, Microbatch crystallization under oil, temperature 277K
Unit Cell:
a: 56.977 Å b: 45.469 Å c: 63.152 Å α: 90.000° β: 107.170° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.12 Solvent Content: 41.85
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.294 35.537 26546 1316 97.990 0.196 0.236 39.025
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.30 50.0 98.9 0.071 ? 24.5 3.7 27096 26798 0.0 0.0 28.070
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.37 99.9 ? ? 8.8 3.8 2694
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.97885 NSLS X4C
Software
Software Name Purpose Version
PHENIX refinement 1.7.2_869
PDB_EXTRACT data extraction 3.100
HKL-2000 data reduction .
HKL-2000 data scaling .
MOLREP phasing .