X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 298 0.17M ammonium acetate, 0.085 M sodium citrate-HCl, pH 5.6, 25.5% PEG4000, 15% glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 45.662 Å b: 160.081 Å c: 192.646 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.21 Solvent Content: 44.39
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.0000 20.0100 95313 4762 98.7500 0.1763 0.2056 32.9759
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 50.000 98.300 0.132 ? 7.000 3.400 ? 180659 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.000 2.030 97.300 ? ? ? 3.300 8898
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.9791 NSLS X29A
Software
Software Name Purpose Version
SCALEPACK data scaling .
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
CBASS data collection .
HKL-3000 data reduction .
PHENIX phasing .