X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 28% PEG3350, 280 mM ammonium sulfate, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 79.810 Å b: 93.590 Å c: 124.780 Å α: 101.700° β: 90.270° γ: 114.180°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.81 Solvent Content: 56.21
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.900 41.6 28958 1459 99.17 0.2290 0.2484 55.4820
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.900 121.596 99.1 ? 0.212 2.8 2.0 28961 28961 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.900 4.110 99.1 ? 0.463 1.0 2.0 4197
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 1.0332 APS 23-ID-D
Software
Software Name Purpose Version
SCALA data scaling 3.3.20
BUSTER-TNT refinement BUSTER 2.10.0
PDB_EXTRACT data extraction 3.11
Blu-Ice data collection Epics
MOSFLM data reduction .
PHASER phasing .
BUSTER refinement 2.10