ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.5	298.0	20% PEG 550 MME, 10% PEG 20k, 0.1 M Amino Acid Mix, 0.1 M Buffer System 1 , pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 298.0K

Unit Cell:

a: 70.989 Å b: 70.989 Å c: 142.972 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 32

Crystal Properties:

Matthew's Coefficient: 3.76 Solvent Content: 67.29

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	?	2.304	35.494	35538	1825	99.72	0.1767	0.2156	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.30	50.00	99.8	0.076	0.052	33.7	11.4	35594	35594	0	0	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.30	2.38	99.5	?	0.542	4.5	11.5	3542

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		80 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SSRL BEAMLINE BL7-1	0.97591	SSRL	BL7-1

Software